QTL for spike-layer uniformity and their influence on yield-related traits in wheat.

ABSTRACT: BACKGROUND:Common wheat (Triticum aestivum L.) is one of the most important food crops worldwide. Wheat spike-layer uniformity related traits (SLURTs) were complex traits that directly affect yield potential and appearance. In this study, quantitative trait locus (QTL) for five SLURTs among inter-tillers were first documented using a recombinant inbred line (RIL) mapping population derived from a cross between Kenong9204 and Jing411 (represented by KJ-RILs). Genetic relationships between SLURTs and yield were characterized in detail. RESULTS:The trait phenotypic performances for the 188 KJ-RILs and their parents were evaluated in eight different environments. The genetic data included in a high-density genetic map derived from the Affymetrix 660 K SNP Array and the corresponding genotypes

SUBMITTER: Zhao C 

PROVIDER: S-EPMC6396499 | biostudies-literature | 2019 Feb

REPOSITORIES: biostudies-literature