New Approach for Thickness Determination of Solution-Deposited Graphene Thin Films.

ABSTRACT: Solution processing-based fabrication techniques such as liquid phase exfoliation may enable economically feasible utilization of graphene and related nanomaterials in real-world devices in the near future. However, measurement of the thickness of the thin film structures fabricated by these approaches remains a significant challenge. By using surface plasmon resonance (SPR), a simple, accurate, and quick measurement of the deposited thickness for inkjet-printed graphene thin films is reported here. We show that the SPR technique is convenient and well-suited for the measurement of thin films formulated from nanomaterial inks, even at sub-10 nm thickness. We also demonstrate that the analysis required to obtain results from the SPR measurements is significantly reduced compared to that req

SUBMITTER: Jussila H 

PROVIDER: S-EPMC6641120 | biostudies-literature | 2017 Jun

REPOSITORIES: biostudies-literature