Stationary beam full-field transmission helium ion microscopy using sub-50 keV He⁺: Projected images and intensity patterns.

ABSTRACT: A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial helium ion microscope (HIM), the in-house built instrument allows full flexibility in experimental configuration. Here, we report projection imaging and intensity patterns obtained from powder and bulk crystalline samples using stationary broad-beam as well as convergent-beam illumination conditions in THIM. The He⁺ ions formed unexpected spot patterns in the far field for MgO, BN and NaCl powder samples, but not for Au-coated MgO. The origin of the spot patterns in these samples was investigated. Surface diffraction of ions was excluded

SUBMITTER: Mousley M 

PROVIDER: S-EPMC6693417 | biostudies-literature | 2019

REPOSITORIES: biostudies-literature