A Sequential Process Model for Cognitive Diagnostic Assessment With Repeated Attempts.

ABSTRACT: When diagnostic assessments are administered to examinees, the mastery status of each examinee on a set of specified cognitive skills or attributes can be directly evaluated using cognitive diagnosis models (CDMs). Under certain circumstances, allowing the examinees to have at least one opportunity to correctly answer the questions and assessments, with repeated attempts on the items, provides many potential benefits. A sequential process model can be extended to model repeated attempts in diagnostic assessments. Two formulations of the sequential generalized deterministic-input noisy-"and"-gate (G-DINA) model were developed in this study. The first extension uses the latent transition analysis (LTA) approach to model changes in the attributes over attempts, and the second extension constr

SUBMITTER: Hung SP 

PROVIDER: S-EPMC6739742 | biostudies-literature | 2019 Oct

REPOSITORIES: biostudies-literature