Amplitude Dependence of Resonance Frequency and its Consequences for Scanning Probe Microscopy.

ABSTRACT: With recent advances in scanning probe microscopy (SPM), it is now routine to determine the atomic structure of surfaces and molecules while quantifying the local tip-sample interaction potentials. Such quantitative experiments using noncontact frequency modulation atomic force microscopy is based on the accurate measurement of the resonance frequency shift due to the tip-sample interaction. Here, we experimentally show that the resonance frequency of oscillating probes used for SPM experiments change systematically as a function of oscillation amplitude under typical operating conditions. This change in resonance frequency is not due to tip-sample interactions, but rather due to the cantilever strain or geometric effects and thus the resonance frequency is a function of the oscillation am

SUBMITTER: Dagdeviren OE 

PROVIDER: S-EPMC6832880 | biostudies-literature | 2019 Oct

REPOSITORIES: biostudies-literature