Coherence properties of the high-energy fourth-generation X-ray synchrotron sources.

ABSTRACT: An analysis of the coherence properties of the fourth-generation high-energy storage rings with emittance values of 10 pm rad is performed. It is presently expected that a storage ring with these low emittance values will reach diffraction limit at hard X-rays. Simulations of coherence properties were performed with the XRT software and an analytical approach for different photon energies from 500 eV to 50 keV. It was demonstrated that a minimum photon emittance (diffraction limit) reached at such storage rings is λ/2π. Using mode decomposition it is shown that, for the parameters of the storage ring considered in this work, the diffraction limit will be reached for soft X-ray energies of 500 eV. About ten modes will contribute to the radiation field at 12 keV photon energy and even more m

SUBMITTER: Khubbutdinov R 

PROVIDER: S-EPMC6853378 | biostudies-literature | 2019 Nov

REPOSITORIES: biostudies-literature