Cryo-focused ion beam preparation of perovskite based solar cells for atom probe tomography.

ABSTRACT: Focused-ion beam lift-out and annular milling is the most common method used for obtaining site specific specimens for atom probe tomography (APT) experiments and transmission electron microscopy. However, one of the main limitations of this technique comes from the structural damage as well as chemical degradation caused by the beam of high-energy ions. These aspects are especially critical in highly-sensitive specimens. In this regard, ion beam milling under cryogenic conditions has been an established technique for damage mitigation. Here, we implement a cryo-focused ion beam approach to prepare specimens for APT measurements from a quadruple cation perovskite-based solar cell device with 19.7% efficiency. As opposed to room temperature FIB milling we found that cryo-milling considerabl

SUBMITTER: Rivas NA 

PROVIDER: S-EPMC6964857 | biostudies-literature | 2020

REPOSITORIES: biostudies-literature