Nanoelectromechanical relay without pull-in instability for high-temperature non-volatile memory.

ABSTRACT: Emerging applications such as the Internet-of-Things and more-electric aircraft require electronics with integrated data storage that can operate in extreme temperatures with high energy efficiency. As transistor leakage current increases with temperature, nanoelectromechanical relays have emerged as a promising alternative. However, a reliable and scalable non-volatile relay that retains its state when powered off has not been demonstrated. Part of the challenge is electromechanical pull-in instability, causing the beam to snap in after traversing a section of the airgap. Here we demonstrate an electrostatically actuated nanoelectromechanical relay that eliminates electromechanical pull-in instability without restricting the dynamic range of motion. It has several advantages over conventi

SUBMITTER: Rana S 

PROVIDER: S-EPMC7055292 | biostudies-literature | 2020 Mar

REPOSITORIES: biostudies-literature