Morphological and Mechanical Characterization of DNA SAMs Combining Nanolithography with AFM and Optical Methods.

ABSTRACT: The morphological and mechanical properties of thiolated ssDNA films self-assembled at different ionic strength on flat gold surfaces have been investigated using Atomic Force Microscopy (AFM). AFM nanoshaving experiments, performed in hard tapping mode, allowed selectively removing molecules from micro-sized regions. To image the shaved areas, in addition to the soft contact mode, we explored the use of the Quantitative Imaging (QI) mode. QI is a less perturbative imaging mode that allows obtaining quantitative information on both sample topography and mechanical properties. AFM analysis showed that DNA SAMs assembled at high ionic strength are thicker and less deformable than films prepared at low ionic strength. In the case of thicker films, the difference between film and substrate You

SUBMITTER: Pinto G 

PROVIDER: S-EPMC7372444 | biostudies-literature | 2020 Jun

REPOSITORIES: biostudies-literature