Impact and Correction of Analytical Positioning on Accuracy of Zircon U-Pb Dating by SIMS.

ABSTRACT: Secondary ion mass spectrometry (SIMS) is one of the most important analytical tools for geochronology, especially for zircon U-Pb dating. Due to its advantages in spatial resolution and analytical precision, SIMS is the preferred option for multi-spot analyses on single zircon grain with complex structures. However, whether or how much the relative positions of multiple analytical spots on one zircon grain affect the U-Pb age accuracy is an important issue that has been neglected by most researchers. In this study, we carried out a series of investigation on the influence of relative analytical position during zircon U-Pb age analyses, using Cameca IMS 1280-HR instrument. The results demonstrated a significant influence on the second spot, with apparent U-Pb age deviation as high as aroun

SUBMITTER: Liu Y 

PROVIDER: S-EPMC7744676 | biostudies-literature | 2020

REPOSITORIES: biostudies-literature