Ontology highlight
ABSTRACT:
SUBMITTER: Han W
PROVIDER: S-EPMC7746715 | biostudies-literature | 2020 Dec
REPOSITORIES: biostudies-literature
Han W W Zheng M M Banerjee A A Luo Y Z YZ Shen L L Khursheed A A
Scientific reports 20201217 1
This paper demonstrates how secondary electron energy spectroscopy (SEES) performed inside a scanning electron microscope (SEM) can be used to map sample atomic number and acquire bulk valence band density of states (DOS) information at low primary beam voltages. The technique uses an electron energy analyser attachment to detect small changes in the shape of the scattered secondary electron (SE) spectrum and extract out fine structure features from it. Close agreement between experimental and t ...[more]