Descriptor selection for predicting interfacial thermal resistance by machine learning methods.

ABSTRACT: Interfacial thermal resistance (ITR) is a critical property for the performance of nanostructured devices where phonon mean free paths are larger than the characteristic length scales. The affordable, accurate and reliable prediction of ITR is essential for material selection in thermal management. In this work, the state-of-the-art machine learning methods were employed to realize this. Descriptor selection was conducted to build robust models and provide guidelines on determining the most important characteristics for targets. Firstly, decision tree (DT) was adopted to calculate the descriptor importances. And descriptor subsets with topX highest importances were chosen (topX-DT, X = 20, 15, 10, 5) to build models. To verify the transferability of the descriptors picked by decision tree,

SUBMITTER: Tian X 

PROVIDER: S-EPMC7804206 | biostudies-literature | 2021 Jan

REPOSITORIES: biostudies-literature