Structural degradation of tungsten sandwiched in hafnia layers determined by in-situ XRD up to 1520 °C.

ABSTRACT: The high-temperature stability of thermal emitters is one of the critical properties of thermophotovoltaic (TPV) systems to obtain high radiative power and conversion efficiencies. W and HfO₂ are ideal due to their high melting points and low vapor pressures. At high temperatures and given vacuum conditions, W is prone to oxidation resulting in instantaneous sublimation of volatile W oxides. Herein, we present a detailed in-situ XRD analysis of the morphological changes of a 3-layer-system: HfO₂/W/HfO₂ layers, in a high-temperature environment, up to 1520 °C. These samples were annealed between 300 °C and 1520 °C for 6 h, 20 h, and 40 h at a vacuum pressure below 3 × 10^-6 mbar using an in-situ high-temperature X-ray diffractometer, which allows i

SUBMITTER: Krishnamurthy GV 

PROVIDER: S-EPMC7870937 | biostudies-literature | 2021 Feb

REPOSITORIES: biostudies-literature