Determination of wheat spike and spikelet architecture and grain traits using X-ray Computed Tomography imaging.

ABSTRACT:

Background

Wheat spike architecture is a key determinant of multiple grain yield components and detailed examination of spike morphometric traits is beneficial to explain wheat grain yield and the effects of differing agronomy and genetics. However, quantification of spike morphometric traits has been very limited because it relies on time-consuming manual measurements.

Results

In this study, using X-ray Computed Tomography imaging, we proposed a method to efficiently detect the 3D architecture of wheat spikes and component spikelets by clustering grains based on their Euclidean distance and relative positions. Morphometric characteristics of wheat spikelets and grains, e.g., number, size and spatial distribution along the spike can be determined. Two commercial wheat cultiv

SUBMITTER: Zhou H 

PROVIDER: S-EPMC7945051 | biostudies-literature | 2021 Mar

REPOSITORIES: biostudies-literature