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Novel Program Scheme of Vertical NAND Flash Memory for Reduction of Z-Interference.

ABSTRACT: Minimizing the variation in threshold voltage (Vt) of programmed cells is required to the extreme level for realizing multi-level-cells; as many as even 5 bits per cell recently. In this work, a recent program scheme to write the cells from the top, for instance the 170th layer, to the bottom, the 1st layer, (T-B scheme) in vertical NAND (VNAND) Flash Memory, is investigated to minimize Vt variation by reducing Z-interference. With the aid of Technology Computer Aided Design (TCAD) the Z-Interference for T-B (84 mV) is found to be better than B-T (105 mV). Moreover, under scaled cell dimensions (e.g., Lg: 31→24 nm), the improvement becomes protruding (T-B: 126 mV and B-T: 162 mV), emphasizing the significance of the T-B program scheme for the next generation VNAND products with the higher bit density.

SUBMITTER: Yi SI

PROVIDER: S-EPMC8160891 | biostudies-literature | 2021 May

REPOSITORIES: biostudies-literature

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Novel Program Scheme of Vertical NAND Flash Memory for Reduction of Z-Interference.

Yi Su-In SI Kim Jungsik J

Micromachines 20210520 5

Minimizing the variation in threshold voltage (Vt) of programmed cells is required to the extreme level for realizing multi-level-cells; as many as even 5 bits per cell recently. In this work, a recent program scheme to write the cells from the top, for instance the 170th layer, to the bottom, the 1st layer, (T-B scheme) in vertical NAND (VNAND) Flash Memory, is investigated to minimize Vt variation by reducing Z-interference. With the aid of Technology Comput ...[more]

PMID: 34065435

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