Directly visualizing carrier transport and recombination at individual defects within 2D semiconductors.

ABSTRACT: Two-dimensional semiconductors (2DSCs) are promising materials for a wide range of optoelectronic applications. While the fabrication of 2DSCs with thicknesses down to the monolayer limit has been demonstrated through a variety of routes, a robust understanding of carrier transport within these materials is needed to guide the rational design of improved practical devices. In particular, the influence of different types of structural defects on transport is critical, but difficult to interrogate experimentally. Here, a new approach to visualizing carrier transport within 2DSCs, Carrier Generation-Tip Collection Scanning Electrochemical Cell Microscopy (CG-TC SECCM), is described which is capable of providing information at the single-defect level. In this approach, carriers are locally gen

SUBMITTER: Hill JW 

PROVIDER: S-EPMC8179556 | biostudies-literature | 2021 Feb

REPOSITORIES: biostudies-literature