Depth correction of 3D NanoSIMS images using secondary electron pixel intensities.

ABSTRACT: Strategies that do not require additional characterization to be performed on the sample or the collection of additional secondary ion signals are needed to depth correct 3D SIMS images of cells. Here, we develop a depth correction strategy that uses the pixel intensities in the secondary electron images acquired during negative-ion NanoSIMS depth profiling to reconstruct the sample morphology. This morphology reconstruction was then used to depth correct the 3D SIMS images that show the components of interest in the sample. As a proof of concept, we applied this approach to NanoSIMS depth profiling data that show the ¹⁵N-enrichment and ¹⁸O-enrichment from ¹⁵N-sphingolipids and ¹⁸O-cholesterol, respectively, within a metabolically labeled Madin-D

SUBMITTER: Gorman BL 

PROVIDER: S-EPMC8337084 | biostudies-literature | 2021 Aug

REPOSITORIES: biostudies-literature