Electron Microprobe/SIMS Determinations of Al in Olivine: Applications to Solar Wind, Pallasites and Trace Element Measurements.

ABSTRACT: Electron probe microanalyzer measurements of trace elements with high accuracy are challenging. Accurate Al measurements in olivine are required to calibrate SIMS implant reference materials for measurement of Al in the solar wind. We adopt a combined EPMA/SIMS approach that is useful for producing SIMS reference materials as well as for EPMA at the ~100 μg g^-1 level. Even for mounts not polished with alumina photoelectron spectroscopy shows high levels of Al surface contamination. In order to minimize electron beam current density, a rastered 50 × 100 μm electron beam was adequate and minimized sensitivity to small Al-rich contaminants. Reproducible analyses of eleven SIMS-cleaned spots on San Carlos olivine agreed at 69.3 ± 1.0 μg g^-1• The known Al mass fraction was

SUBMITTER: Paque JM 

PROVIDER: S-EPMC8350971 | biostudies-literature | 2020 Sep

REPOSITORIES: biostudies-literature