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Determination of the refractive index and wavelength-dependent optical properties of few-layer CrCl 3 within the Fresnel formalism.

ABSTRACT: Based on previous reports on the optical microscopy contrast of mechanically exfoliated few layer CrCl 3 transferred on 285 nm and 270 nm SiO 2 on Si(100), we focus on the experimental determination of an effective mean complex refractive index via a fitting analysis based on the Fresnel equations formalism. Accordingly, the layer and wavelength-dependent absorbance and reflectance are calculated. Layer and wavelength-dependent optical contrast curves are then evaluated demonstrating that the contrast is significantly high only around well-defined wavelength bands. This is validated a posteriori, by experimental UV-Vis absorbance data. The present study aims to show the way towards the most reliable determination of thickness of the 2D material flakes during exfoliation.

SUBMITTER: Kazim S

PROVIDER: S-EPMC8359837 | biostudies-literature | 2021 Aug

REPOSITORIES: biostudies-literature

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Determination of the refractive index and wavelength-dependent optical properties of few-layer CrCl 3 within the Fresnel formalism.

Kazim Shafaq S Gunnella Roberto R Zannotti Marco M Giovannetti Rita R Klimczuk Tomasz T Ottaviano Luca L

Journal of microscopy 20210517 2

Based on previous reports on the optical microscopy contrast of mechanically exfoliated few layer CrCl 3 transferred on 285 nm and 270 nm SiO 2 on Si(100), we focus on the experimental determination of an effective mean complex refractive index via a fitting analysis based on the Fresnel equations formalism. Accordingly, the layer and wavelength-dependent absorbance and reflectance are calculated. Layer and wavelength-dependent optical contrast curves are then evaluated demonstrating that th ...[more]

PMID: 33864639

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