Cantilever signature of tip detachment during contact resonance AFM.

ABSTRACT: Contact resonance atomic force microscopy, piezoresponse force microscopy, and electrochemical strain microscopy are atomic force microscopy modes in which the cantilever is held in contact with the sample at a constant average force while monitoring the cantilever motion under the influence of a small, superimposed vibrational signal. Though these modes depend on permanent contact, there is a lack of detailed analysis on how the cantilever motion evolves when this essential condition is violated. This is not an uncommon occurrence since higher operating amplitudes tend to yield better signal-to-noise ratio, so users may inadvertently reduce their experimental accuracy by inducing tip-sample detachment in an effort to improve their measurements. We shed light on this issue by deliberately

SUBMITTER: Kalafut D 

PROVIDER: S-EPMC8630435 | biostudies-literature | 2021

REPOSITORIES: biostudies-literature