A Major Quantitative Trait Loci Cluster Controlling Three Components of Yield and Plant Height Identified on Chromosome 4B of Common Wheat.

ABSTRACT: Wheat yield is not only affected by three components of yield, but also affected by plant height (PH). Identification and utilization of the quantitative trait loci (QTL) controlling these four traits is vitally important for breeding high-yielding wheat varieties. In this work, we conducted a QTL analysis using the recombinant inbred lines (RILs) derived from a cross between two winter wheat varieties of China, "Nongda981" (ND981) and "Nongda3097" (ND3097), exhibiting significant differences in spike number per unit area (SN), grain number per spike (GNS), thousand grain weight (TGW), and PH. A total of 11 environmentally stable QTL for these four traits were detected. Among them, four major and stable QTLs (QSn.cau-4B-1.1, QGns.cau-4B-1, QTgw.cau-4B-1.1, and <

SUBMITTER: Wen S 

PROVIDER: S-EPMC8786729 | biostudies-literature | 2021

REPOSITORIES: biostudies-literature