Atomically Resolved Electrically Active Intragrain Interfaces in Perovskite Semiconductors.

ABSTRACT: Deciphering the atomic and electronic structures of interfaces is key to developing state-of-the-art perovskite semiconductors. However, conventional characterization techniques have limited previous studies mainly to grain-boundary interfaces, whereas the intragrain-interface microstructures and their electronic properties have been much less revealed. Herein using scanning transmission electron microscopy, we resolved the atomic-scale structural information on three prototypical intragrain interfaces, unraveling intriguing features clearly different from those from previous observations based on standalone films or nanomaterial samples. These intragrain interfaces include composition boundaries formed by heterogeneous ion distribution, stacking faults resulted from wrongly stacked crysta

SUBMITTER: Cai S 

PROVIDER: S-EPMC8815067 | biostudies-literature | 2022 Feb

REPOSITORIES: biostudies-literature