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Balancing the film strain of organic semiconductors for ultrastable organic transistors with a five-year lifetime.


ABSTRACT: The instability of organic field-effect transistors (OFETs) is one key obstacle to practical application and is closely related to the unstable aggregate state of organic semiconductors (OSCs). However, the underlying reason for this instability remains unclear, and no effective solution has been developed. Herein, we find that the intrinsic tensile and compressive strains that exist in OSC films are the key origins for aggregate state instability and device degradation. We further report a strain balance strategy to stabilize the aggregate state by regulating film thickness, which is based on the unique transition from tensile strain to compressive strain with increasing film thickness. Consequently, a strain-free and ultrastable OSC film is obtained by regulating the film thickness, with which an ultrastable OFET with a five-year lifetime is realized. This work provides a deeper understanding of and a solution to the instability of OFETs and sheds light on their industrialization.

SUBMITTER: Chen X 

PROVIDER: S-EPMC8927116 | biostudies-literature | 2022 Mar

REPOSITORIES: biostudies-literature

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Balancing the film strain of organic semiconductors for ultrastable organic transistors with a five-year lifetime.

Chen Xiaosong X   Wang Zhongwu Z   Qi Jiannan J   Hu Yongxu Y   Huang Yinan Y   Sun Shougang S   Sun Yajing Y   Gong Wenbin W   Luo Langli L   Zhang Lifeng L   Du Haiyan H   Hu Xiaoxia X   Han Cheng C   Li Jie J   Ji Deyang D   Li Liqiang L   Hu Wenping W  

Nature communications 20220316 1


The instability of organic field-effect transistors (OFETs) is one key obstacle to practical application and is closely related to the unstable aggregate state of organic semiconductors (OSCs). However, the underlying reason for this instability remains unclear, and no effective solution has been developed. Herein, we find that the intrinsic tensile and compressive strains that exist in OSC films are the key origins for aggregate state instability and device degradation. We further report a stra  ...[more]

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