Tandem Probe Analysis Mode for Synchrotron XFM: Doubling Throughput Capacity.

ABSTRACT: Synchrotron-based X-ray fluorescence microscopy (XFM) analysis is a powerful technique that can be used to visualize elemental distributions across a broad range of sample types. Compared to conventional mapping techniques such as laser ablation inductively coupled plasma mass spectrometry or benchtop XFM, synchrotron-based XFM provides faster and more sensitive analyses. However, access to synchrotron XFM beamlines is highly competitive, and as a result, these beamlines are often oversubscribed. Therefore, XFM experiments that require many large samples to be scanned can penalize beamline throughput. Our study was largely driven by the need to scan large gels (170 cm²) using XFM without decreasing beamline throughput. We describe a novel approach for acquiring two sets of XFM d

SUBMITTER: Doolette CL 

PROVIDER: S-EPMC8943523 | biostudies-literature | 2022 Mar

REPOSITORIES: biostudies-literature