Sub-micrometer focusing setup for high-pressure crystallography at the Extreme Conditions beamline at PETRA III.

ABSTRACT: Scientific tasks aimed at decoding and characterizing complex systems and processes at high pressures set new challenges for modern X-ray diffraction instrumentation in terms of X-ray flux, focal spot size and sample positioning. Presented here are new developments at the Extreme Conditions beamline (P02.2, PETRA III, DESY, Germany) that enable considerable improvements in data collection at very high pressures and small scattering volumes. In particular, the focusing of the X-ray beam to the sub-micrometer level is described, and control of the aberrations of the focusing compound refractive lenses is made possible with the implementation of a correcting phase plate. This device provides a significant enhancement of the signal-to-noise ratio by conditioning the beam shape profile at the f

SUBMITTER: Glazyrin K 

PROVIDER: S-EPMC9070721 | biostudies-literature | 2022 May

REPOSITORIES: biostudies-literature