Atomic-scale investigation of MgO growth on fused quartz using angle-dependent NEXAFS measurements.

ABSTRACT: The phenomena related to thin film growth have always been interesting to the scientific community. Experiments related to these phenomena not only provide an understanding but also suggest a path for the controlled growth of these films. For the present work, MgO thin film growth on fused quartz was investigated using angle-dependent near-edge X-ray absorption fine structure (NEXAFS) measurements. To understand the growth of MgO, sputtering was allowed for 5, 10, 25, 36, 49, 81, 144, 256, and 400 min in a vacuum better than 5.0 × 10^-7 torr. NEXAFS measurements revealed the evolution of MgO at the surface of fused quartz for sputtering durations of 144, 256, and 400 min. Below these sputtering durations, no MgO was observed. NEXAFS measurements further envisaged a systematic imp

SUBMITTER: Singh JP 

PROVIDER: S-EPMC9085907 | biostudies-literature | 2018 Sep

REPOSITORIES: biostudies-literature