Necessity of two-dimensional visualization of validity in the nanomechanical mapping of atomic force microscopy for sulphur cross-linked rubber.

ABSTRACT: The importance of the two-dimensional (2D) visualization of validity for nanomechanical mapping in atomic force microscopy (AFM) for sulphur cross-linked rubber is emphasized for accurately interpreting the nanoscale physical properties on the surface of the soft material. The "R-factor," evaluated to be the difference between the experimental and theoretical force-deformation curves, was considered to be the reliability index of the AFM analysis for all data points on the sample surface. A small R-factor corresponds to high accuracy. The advantage of the R-factor mapping method is demonstrated using nanomechanical mapping data of the inhomogeneous isoprene rubber network by the Johnson-Kendall-Roberts and the Derjaguin, Muller, and Toporov contact mechanics models. Th

SUBMITTER: Ohashi T 

PROVIDER: S-EPMC9086381 | biostudies-literature | 2018 Sep

REPOSITORIES: biostudies-literature