Nanoscale Visualization of the Electron Conduction Channel in the SiO/Graphite Composite Anode.

ABSTRACT: Conductive atomic force microscopy (C-AFM) is widely used to determine the electronic conductivity of a sample surface with nanoscale spatial resolution. However, the origin of possible artifacts has not been widely researched, hindering the accurate and reliable interpretation of C-AFM imaging results. Herein, artifact-free C-AFM is used to observe the electron conduction channels in Si-based composite anodes. The origin of a typical C-AFM artifact induced by surface morphology is investigated using a relevant statistical method that enables visualization of the contribution of artifacts in each C-AFM image. The artifact is suppressed by polishing the sample surface using a cooling cross-section polisher, which is confirmed by Pearson correlation analysis. The artifact-free C-AFM image wa

SUBMITTER: Park G 

PROVIDER: S-EPMC9285628 | biostudies-literature | 2022 Jul

REPOSITORIES: biostudies-literature