Optical emission from focused ion beam milled halide perovskite device cross-sections.

ABSTRACT: Cross-sectional transmission electron microscopy has been widely used to investigate organic-inorganic hybrid halide perovskite-based optoelectronic devices. Electron-transparent specimens (lamellae) used in such studies are often prepared using focused ion beam (FIB) milling. However, the gallium ions used in FIB milling may severely degrade the structure and composition of halide perovskites in the lamellae, potentially invalidating studies performed on them. In this work, the close relationship between perovskite structure and luminescence is exploited to examine the structural quality of perovskite solar cell lamellae prepared by FIB milling. Through hyperspectral cathodoluminescence (CL) mapping, the perovskite layer was found to remain optically active with a slightly blue-shifted lu

SUBMITTER: Kosasih FU 

PROVIDER: S-EPMC9304233 | biostudies-literature | 2022 Jun

REPOSITORIES: biostudies-literature