End-to-end deep learning framework for printed circuit board manufacturing defect classification.

ABSTRACT: We report a complete deep-learning framework using a single-step object detection model in order to quickly and accurately detect and classify the types of manufacturing defects present on Printed Circuit Board (PCBs). We describe the complete model architecture and compare with the current state-of-the-art using the same PCB defect dataset. These benchmark methods include the Faster Region Based Convolutional Neural Network (FRCNN) with ResNet50, RetinaNet, and You-Only-Look-Once (YOLO) for defect detection and identification. Results show that our method achieves a 98.1% mean average precision(mAP[IoU = 0.5]) on the test samples using low-resolution images. This is 3.2% better than the state-of-the-art using low-resolution images (YOLO V5m) and 1.4% better than the state-of-the-art using

SUBMITTER: Bhattacharya A 

PROVIDER: S-EPMC9307836 | biostudies-literature | 2022 Jul

REPOSITORIES: biostudies-literature