Dislocation substructures in pure aluminium after creep deformation as studied by electron backscatter diffraction

ABSTRACT: In the present work, electron backscatter diffraction is used to investigate the influence of crystal orientation and stress level on the dislocation structures generated during primary and steady-state creep in pure aluminium (99.8%). The goal is to characterize features of the microstructure with a statistically sound approach. In the present work, electron backscatter diffraction was used to determine the microscopic dislocation structures generated during creep (with tests interrupted at the steady state) in pure 99.8% aluminium. This material was investigated at two different stress levels, corresponding to the power-law and power-law breakdown regimes. The results show that the formation of subgrain cellular structures occurs independently of the crystallographic orientation. However

SUBMITTER: Serrano-Munoz I 

PROVIDER: S-EPMC9348881 | biostudies-literature | 2022 Jul

REPOSITORIES: biostudies-literature