Electron diffraction characterization of nanocrystalline materials using a Rietveld-based approach. Part I. Methodology.

ABSTRACT: Transmission electron microscopy is a powerful experimental tool, very effective for the complete characterization of nanocrystalline materials by employing a combination of imaging, spectroscopy and diffraction techniques. Electron powder diffraction (EPD) pattern fingerprinting in association with chemical information from spectroscopy can be used to deduce the identity of the crystalline phases. Furthermore, EPD has similar potential to X-ray powder diffraction (XRPD) for extracting additional information regarding material specimens, such as microstructural features and defect structures. The aim of this paper is to extend a full-pattern fitting procedure, broadly used for analysing XRPD patterns, to EPD. The interest of this approach is twofold: in the first place, the relatively shor

SUBMITTER: Sinha A 

PROVIDER: S-EPMC9348886 | biostudies-literature | 2022 Aug

REPOSITORIES: biostudies-literature