Insights into dynamic sliding contacts from conductive atomic force microscopy.

ABSTRACT: Friction in nanoscale contacts is determined by the size and structure of the interface that is hidden between the contacting bodies. One approach to investigating the origins of friction is to measure electrical conductivity as a proxy for contact size and structure. However, the relationships between contact, friction and conductivity are not fully understood, limiting the usefulness of such measurements for interpreting dynamic sliding properties. Here, atomic force microscopy (AFM) was used to simultaneously acquire lattice resolution images of the lateral force and current flow through the tip-sample contact formed between a highly oriented pyrolytic graphite (HOPG) sample and a conductive diamond AFM probe to explore the underlying mechanisms and correlations between friction and con

SUBMITTER: Chan N 

PROVIDER: S-EPMC9417200 | biostudies-literature | 2020 Sep

REPOSITORIES: biostudies-literature