Correlation analysis of vibration modes in physical vapour deposited Bi₂Se₃ thin films probed by the Raman mapping technique.

ABSTRACT: In this work, the Raman spectroscopy mapping technique is used for the analysis of mechanical strain in Bi₂Se₃ thin films of various (3-400 nm) thicknesses synthesized by physical vapour deposition on amorphous quartz and single-layer graphene substrates. The evaluation of strain effects is based on the correlation analysis of in-plane (E² _g) and out-of-plane (A² _1g) Raman mode positions. For Bi₂Se₃ films deposited on quartz, experimental datapoints are scattered along the line with a slope of ∼0.85, related to the distribution of hydrostatic strain. In contrast to quartz/Bi₂Se₃ samples, for graphene/Bi₂Se₃ heterostructures with the same thicknesses, an additi

SUBMITTER: Niherysh KA 

PROVIDER: S-EPMC9419075 | biostudies-literature | 2021 Nov

REPOSITORIES: biostudies-literature