Dynamics of the charging-induced imaging instability in transmission electron microscopy.

ABSTRACT: Revolutionary microscopy technologies for aberration correction in spatial and energy aspects have exhibited continuous progress, pushing forward the information limit of materials research down to a scale of sub-angstrom and milli-electron voltage. Nevertheless, imaging quality could still suffer due to sample instability, e.g. the charging effect, which always comes along with electron microscopy characterizations. Herein, using a defocus estimation algorithm and an in situ image feature tracking method, we quantitatively studied the image drifting dynamics induced by the charging on transmission electron microscopy (TEM) carrier grids with tunable electrical conductivity. Experimental evidence clarifies the debate about the charge types, proving that the irradiation of the

SUBMITTER: Wang L 

PROVIDER: S-EPMC9419410 | biostudies-literature | 2021 Jun

REPOSITORIES: biostudies-literature