Expected affine: A registration method for damaged section in serial sections electron microscopy.

ABSTRACT: Registration is essential for the volume reconstruction of biological tissues using serial section electron microscope (ssEM) images. However, due to environmental disturbance in section preparation, damage in long serial sections is inevitable. It is difficult to register the damaged sections with the common serial section registration method, creating significant challenges in subsequent neuron tracking and reconstruction. This paper proposes a general registration method that can be used to register damaged sections. This method first extracts the key points and descriptors of the sections to be registered and matches them via a mutual nearest neighbor matcher. K-means and Random Sample Consensus (RANSAC) are used to cluster the key points and approximate the local affine matrice

SUBMITTER: Xin T 

PROVIDER: S-EPMC9478550 | biostudies-literature | 2022

REPOSITORIES: biostudies-literature