The electric double layer effect and its strong suppression at Li⁺ solid electrolyte/hydrogenated diamond interfaces.

ABSTRACT: The electric double layer (EDL) effect at solid electrolyte/electrode interfaces has been a key topic in many energy and nanoelectronics applications (e.g., all-solid-state Li⁺ batteries and memristors). However, its characterization remains difficult in comparison with liquid electrolytes. Herein, we use a novel method to show that the EDL effect, and its suppression at solid electrolyte/electronic material interfaces, can be characterized on the basis of the electric conduction characteristics of hydrogenated diamond(H-diamond)-based EDL transistors (EDLTs). Whereas H-diamond-based EDLT with a Li-Si-Zr-O Li⁺ solid electrolyte showed EDL-induced hole density modulation over a range of up to three orders of magnitude, EDLT with a Li-La-Ti-O (LLTO) Li⁺ solid

SUBMITTER: Tsuchiya T 

PROVIDER: S-EPMC9814946 | biostudies-literature | 2021 Aug

REPOSITORIES: biostudies-literature