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Investigation of the Optical Properties of Indium Tin Oxide Thin Films by Double Integration Sphere Combined with the Numerical IAD Method.

ABSTRACT: Transparent conductive electrodes have become essential components of numerous optoelectronic devices. However, their optical properties are typically characterized by the direct transmittance achieved by making use of spectrophotometers, avoiding an in-depth knowledge of the processes involved in radiation attenuation. A different procedure based on the Double Integration Sphere combined with the numerical Inverse Adding-Doubling (IAD) method is employed in this work to provide a comprehensive description of the physical processes limiting the light transmittance in commercial indium tin oxide (ITO) deposited on flexible PET samples, highlighting the noticeable contribution of light scattering on the total extinction of radiation. Moreover, harnessing their flexibility, the samples were subjected to different mechanical stresses to assess their impact on the material's optical and electrical properties.

SUBMITTER: Toral-Lopez A

PROVIDER: S-EPMC9967440 | biostudies-literature | 2023 Feb

REPOSITORIES: biostudies-literature

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Investigation of the Optical Properties of Indium Tin Oxide Thin Films by Double Integration Sphere Combined with the Numerical IAD Method.

Toral-Lopez Alejandro A Pérez María M MM Rodríguez-Águila Ana Belen AB Cardona Juan C JC Ionescu Ana M AM Godoy Andres A

Materials (Basel, Switzerland) 20230208 4

Transparent conductive electrodes have become essential components of numerous optoelectronic devices. However, their optical properties are typically characterized by the direct transmittance achieved by making use of spectrophotometers, avoiding an in-depth knowledge of the processes involved in radiation attenuation. A different procedure based on the Double Integration Sphere combined with the numerical Inverse Adding-Doubling (IAD) method is employed in this work to provide a comprehensive ...[more]

PMID: 36837057

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Project description:Fabrication and organosilane-functionalization and characterization of nanostructured ITO electrodes are reported. Nanostructured ITO electrodes were obtained by electron beam evaporation, and a subsequent annealing treatment was selectively performed to modify their crystalline state. An increase in geometrical surface area in comparison with thin-film electrodes area was observed by atomic force microscopy, implying higher electroactive surface area for nanostructured ITO electrodes and thus higher detection levels. To investigate the increase in detectability, chemical organosilane-functionalization of nanostructured ITO electrodes was performed. The formation of 3-glycidoxypropyltrimethoxysilane (GOPTS) layers was detected by X-ray photoelectron spectroscopy. As an indirect method to confirm the presence of organosilane molecules on the ITO substrates, cyclic voltammetry and electrochemical impedance spectroscopy (EIS) were also carried out. Cyclic voltammograms of functionalized ITO electrodes presented lower reduction-oxidation peak currents compared with non-functionalized ITO electrodes. These results demonstrate the presence of the epoxysilane coating on the ITO surface. EIS showed that organosilane-functionalized electrodes present higher polarization resistance, acting as an electronic barrier for the electron transfer between the conductive solution and the ITO electrode. The results of these electrochemical measurements, together with the significant difference in the X-ray spectra between bare ITO and organosilane-functionalized ITO substrates, may point to a new exploitable oxide-based nanostructured material for biosensing applications. As a first step towards sensing, rapid functionalization of such substrates and their application to electrochemical analysis is tested in this work. Interestingly, oxide-based materials are highly integrable with the silicon chip technology, which would permit the easy adaptation of such sensors into lab-on-a-chip configurations, providing benefits such as reduced size and weight to facilitate on-chip integration, and leading to low-cost mass production of microanalysis systems.

Dataset Information

Investigation of the Optical Properties of Indium Tin Oxide Thin Films by Double Integration Sphere Combined with the Numerical IAD Method.

Publications

Investigation of the Optical Properties of Indium Tin Oxide Thin Films by Double Integration Sphere Combined with the Numerical IAD Method.

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