Ontology highlight
ABSTRACT:
SUBMITTER: Ivanova EP
PROVIDER: S-EPMC3240996 | biostudies-literature | 2011
REPOSITORIES: biostudies-literature
Ivanova Elena P EP Truong Vi Khanh VK Webb Hayden K HK Baulin Vladimir A VA Wang James Y JY Mohammodi Narges N Wang Feng F Fluke Christopher C Crawford Russell J RJ
Scientific reports 20111122
Magnetron sputtering techniques were used to prepare molecularly smooth titanium thin films possessing an average roughness between 0.18 nm and 0.52 nm over 5 μm × 5 μm AFM scanning areas. Films with an average roughness of 0.52 nm or lower were found to restrict the extent of P. aeruginosa cell attachment, with less than 0.5% of all available cells being retained on the surface. The attachment of S. aureus cells was also limited on films with an average surface roughness of 0.52 nm, however the ...[more]