Ontology highlight
ABSTRACT:
SUBMITTER: Renard VT
PROVIDER: S-EPMC3684805 | biostudies-literature | 2013
REPOSITORIES: biostudies-literature
Renard V T VT Duchemin I I Niida Y Y Fujiwara A A Hirayama Y Y Takashina K K
Scientific reports 20130101
The fundamental properties of valleys are recently attracting growing attention due to electrons in new and topical materials possessing this degree-of-freedom and recent proposals for valleytronics devices. In silicon MOSFETs, the interest has a longer history since the valley degree of freedom had been identified as a key parameter in the observation of the controversial "metallic behaviour" in two dimensions. However, while it has been recently demonstrated that lifting valley degeneracy can ...[more]