Ptychographic X-ray speckle tracking with multi-layer Laue lens systems.

ABSTRACT: The ever-increasing brightness of synchrotron radiation sources demands improved X-ray optics to utilize their capability for imaging and probing biological cells, nano-devices and functional matter on the nanometre scale with chemical sensitivity. Hard X-rays are ideal for high-resolution imaging and spectroscopic applications owing to their short wavelength, high penetrating power and chemical sensitivity. The penetrating power that makes X-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques have enabled the fabrication of a series of highly focusing X-ray lenses, known as wedged multi-layer Laue lenses. Improvements to the lens design and fabrication technique demand an accurate, robust, in situ and at-waveleng

SUBMITTER: Morgan AJ 

PROVIDER: S-EPMC7401788 | biostudies-literature | 2020 Aug

REPOSITORIES: biostudies-literature