Structural Assessment of Interfaces in Projected Phase-Change Memory.

ABSTRACT: Non-volatile memories based on phase-change materials have gained ground for applications in analog in-memory computing. Nonetheless, non-idealities inherent to the material result in device resistance variations that impair the achievable numerical precision. Projected-type phase-change memory devices reduce these non-idealities. In a projected phase-change memory, the phase-change storage mechanism is decoupled from the information retrieval process by using projection of the phase-change material's phase configuration onto a projection liner. It has been suggested that the interface resistance between the phase-change material and the projection liner is an important parameter that dictates the efficacy of the projection. In this work, we establish a metrology framework to assess and un

SUBMITTER: Bragaglia V 

PROVIDER: S-EPMC9147056 | biostudies-literature | 2022 May

REPOSITORIES: biostudies-literature