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2025
(1)
2022
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Electron-Beam Excited Conductive Atomic Force Microscopy for Back Contact Free, Wafer-Scale and In-Line Compatible Electrical Characterization of 2D Materials.
Not available
S-EPMC12667532
|
biostudies-literature
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Temperature Dependence of the Indirect Gap and the Direct Optical Transitions at the High-Symmetry Point of the Brillouin Zone and Band Nesting in MoS
2
, MoSe
2
, MoTe
2
, WS
2
, and WSe
2
Crystals.
Not available
S-EPMC8978178
|
biostudies-literature
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