Correlating dynamic strain and photoluminescence of solid-state defects with stroboscopic x-ray diffraction microscopy.

ABSTRACT: Control of local lattice perturbations near optically-active defects in semiconductors is a key step to harnessing the potential of solid-state qubits for quantum information science and nanoscale sensing. We report the development of a stroboscopic scanning X-ray diffraction microscopy approach for real-space imaging of dynamic strain used in correlation with microscopic photoluminescence measurements. We demonstrate this technique in 4H-SiC, which hosts long-lifetime room temperature vacancy spin defects. Using nano-focused X-ray photon pulses synchronized to a surface acoustic wave launcher, we achieve an effective time resolution of ~100 ps at a 25 nm spatial resolution to map micro-radian dynamic lattice curvatures. The acoustically induced lattice distortions near an engineered scatt

SUBMITTER: Whiteley SJ 

PROVIDER: S-EPMC6662806 | biostudies-literature | 2019 Jul

REPOSITORIES: biostudies-literature